Electron Backscatter Diffraction (EBSD)

EBSD is an SEM based technique that can be used to analyse the diffraction patterns generated when an electron beam interacts with a crystalline sample. The diffraction patterns are imaged on a phosphor screen and analysed by the HKL Channel5 software to determine the orientation of the crystal structure. The technique can be used to analyse:

• absolute crystallographic orientation
• microtextures and preferred crystal orientation
• deformation and strain
• polymorph identification
• damage to crystal structure
• grain size and grain boundaries

For further details about EBSD and sample requirements please contact the SEM staff.