|
|
SIMS Tutorials
- A beginers guide to the Cameca SIMS instruments.

- SIMS Analytical Procedures for the Earth Sciences.

Comments and corrections to the documents above can be made to J. Craven (John.Craven@ed.ac.uk)
Suggested Reading
Below is a list of recommended reading for users of the Facility
Hinton R.W. (1990) Ion microprobe trace element analysis of silicates: Measurement of multi-element glasses. Chem. Geol. 83 11-25
Hervig, R. L., Mazdab, F. K., Williams, P., Guan, Y., Huss, G. R., Leshin, L. A.
(2006) Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on
quantitative analysis. Chemical Geology, 227, 83-99.
Fitzsimons I.C.W., Harte B. and Clark R.M. (2000) SIMS stable isotope measurement: counting statistics and analytical precision. Mineral. Mag. 64 59-83
Swart P.K. (1990) Calibration of the Ion Microprobe for the Quantitive Determination of Strontium, Iron, Manganese and Magnesium in Carbonate Minerals.
Slodzian G. (1980) Microanalyzers Using Secondary Ion Emission. Advances in Electronics and Electronic Physics. Supplement 13B
Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, by A. Benninghoven, F. G. Rudenauer, and H. W. Werner, Wiley, New York, 1987 (1227 pages).
|