Comments and corrections to the document above can be made to J. Craven (John.Craven@ed.ac.uk)
- A beginers guide to the Cameca SIMS instruments.
Edinburgh Ion Microprobe Facility (EIMF)1998: Secondary Ion Mass Spectrometry (SIMS).
Below is a list of recommended reading for users of the Facility
Hinton R.W. (1990) Ion microprobe trace element analysis of silicates: Measurement of multi-element glasses. Chem. Geol. 83 11-25
Hervig, R. L., Mazdab, F. K., Williams, P., Guan, Y., Huss, G. R., Leshin, L. A.
(2006) Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on
quantitative analysis. Chemical Geology, 227, 83-99.
Fitzsimons I.C.W., Harte B. and Clark R.M. (2000) SIMS stable isotope measurement: counting statistics and analytical precision. Mineral. Mag. 64 59-83
Swart P.K. (1990) Calibration of the Ion Microprobe for the Quantitive Determination of Strontium, Iron, Manganese and Magnesium in Carbonate Minerals.
Slodzian G. (1980) Microanalyzers Using Secondary Ion Emission. Advances in Electronics and Electronic Physics. Supplement 13B
Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, by A. Benninghoven, F. G. Rudenauer, and H. W. Werner, Wiley, New York, 1987 (1227 pages).
Secondary Mass Spectrometry in the Earth Sciences: Gleaning the big picture from a small spot. Mineralogical Association of Canada
Short Course Series Volume 41. Ed: Mostafa Fayek, Department of Geological Sciences, University of Manitoba
Winnipeg, Manitoba, Canada, R3T 2N2.