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Science and Engineering at The University of Edinburgh

School of GeoSciences

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SIMS Tutorials

  • A beginners guide to the Cameca SIMS instruments. Edinburgh Ion Microprobe Facility (EIMF)1998: Secondary Ion Mass Spectrometry (SIMS).
  • PDF file advertising the Facility for NERC Advertisment.
Comments and corrections to the document above can be made to J. Craven (John.Craven@ed.ac.uk)

Suggested Reading

Below is a list of recommended reading for users of the Facility

  • Hinton R.W. (1990) Ion microprobe trace element analysis of silicates: Measurement of multi-element glasses. Chem. Geol. 83 11-25

  • Hervig, R. L., Mazdab, F. K., Williams, P., Guan, Y., Huss, G. R., Leshin, L. A. (2006) Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis. Chemical Geology, 227, 83-99.

  • Fayek M. (ed) (2009) Secondary Ion Mass Spectrometry in the Earth Sciences. Min. Assoc. Canada v41 p1-150

  • Fitzsimons I.C.W., Harte B. and Clark R.M. (2000) SIMS stable isotope measurement: counting statistics and analytical precision. Mineral. Mag. 64 59-83

  • Swart P.K. (1990) Calibration of the Ion Microprobe for the Quantitive Determination of Strontium, Iron, Manganese and Magnesium in Carbonate Minerals.

  • Slodzian G. (1980) Microanalyzers Using Secondary Ion Emission. Advances in Electronics and Electronic Physics. Supplement 13B

  • Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, by A. Benninghoven, F. G. Rudenauer, and H. W. Werner, Wiley, New York, 1987 (1227 pages).

  • Secondary Mass Spectrometry in the Earth Sciences: Gleaning the big picture from a small spot. Mineralogical Association of Canada Short Course Series Volume 41. Ed: Mostafa Fayek, Department of Geological Sciences, University of Manitoba Winnipeg, Manitoba, Canada, R3T 2N2.

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