Science and Engineering at The University of Edinburgh |
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Section Contents
- Electron Probe
- Instrument Specification
- Sample Requirements
- Access and Charges
- Support Equipment
- Accommodation
- Electron Probe Links
- Contacts
Standards
- University Homepage
- Schools & departments
- School of GeoSciences
- Facilities
- Electron Probe
Instrument Specification
The Facility operates a fully automated electron probe microanalyser:
| Cameca SX100 | |
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The CAMECA SX100 was installed in 2002. It is equipped with five vertical crystal spectrometers and a PGT Spirit energy dispersive analyser. Backscattered electron, secondary electron and X-ray imaging facilities are available. The instrument operates under Windows, using Cameca's PeakSight software. Specialised software functionalities include Dynamic Beam Tracking for improved sample positioning (enabling automated analysis of very small areas or grains), quantitative X-ray mapping for quantitative elemental spatial distribution, and quantitative analysis of thin layers. The crystals installed enable analysis of elements between boron (Z=5) and uranium (Z=92). They are:Spectrometer 1 PET, TAP, PC0 PC2 Spectrometer 2 LPET, LLIF Spectrometer 3 LPET, LLIF Spectrometer 4 LIF, PET, TAP, PC1 Spectrometer 5 LTAP, LPET The large analysing crystals (LTAP, LPET and LLIF) enable higher analytical precisions, lower detection limits and faster analysis times. They also enable high quality analysis of beam-sensitive materials such as glasses and carbonate minerals. |
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Last modified: 09 Mar, 2012 --- Page contact:
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