The Facility operates a fully automated electron probe microanalyser:
Cameca SX100
Our CAMECA SX100 is equipped with five vertical crystal spectrometers and a PGT Spirit energy dispersive analyser.
Backscattered electron, secondary electron and X-ray imaging
facilities are available. A light microscope provides reflected and transmitted light images at magnifications between x100 and x900. The instrument operates under Windows, using the latest version of Cameca's PeakSight software. Specialised software functionalities include Dynamic Beam Tracking for improved sample positioning (enabling automated analysis of very small areas or grains), quantitative X-ray mapping for quantitative elemental spatial distribution, and quantitative analysis of thin layers.
The crystals installed enable analysis of elements between boron (Z=5) and uranium (Z=92). They are:
This configuration makes the instrument exceptionally versatile within a wide range of applications. The large analysing crystals (LTAP, LPET and LLIF) enable higher analytical precisions, lower detection limits and faster analysis times. They also enable high quality analysis of beam-sensitive materials such as glasses and carbonate minerals.